sem and mapping images Search Results


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Verlag GmbH sem images and mappings of the cathode and electrolyte
Sem Images And Mappings Of The Cathode And Electrolyte, supplied by Verlag GmbH, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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JEOL sem and mapping images
Sem And Mapping Images, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Carl Zeiss scanning electron microscope (sem) equipped with electron back-scatter diffraction (ebsd) orientation image mapping (oim) capability
Scanning Electron Microscope (Sem) Equipped With Electron Back Scatter Diffraction (Ebsd) Orientation Image Mapping (Oim) Capability, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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JEOL sem imaging and x-ray intensity mapping
Sem Imaging And X Ray Intensity Mapping, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Carl Zeiss supra55 sem equipped with eds
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Supra55 Sem Equipped With Eds, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Carl Zeiss sem images and edx maps
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Sem Images And Edx Maps, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Carl Zeiss sem and eds spectroscopy layered elemental mappings
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Sem And Eds Spectroscopy Layered Elemental Mappings, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Carl Zeiss scanning electron microscope (sem) and eds mapping
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Scanning Electron Microscope (Sem) And Eds Mapping, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Carl Zeiss fe-sem micrographs and elemental mapping
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Fe Sem Micrographs And Elemental Mapping, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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JEOL sem and element mapping images
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Sem And Element Mapping Images, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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AttoLight scanning electron microscopy (sem)-cl mapping and polarization-resolved cl spectroscopy sem-cl
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Scanning Electron Microscopy (Sem) Cl Mapping And Polarization Resolved Cl Spectroscopy Sem Cl, supplied by AttoLight, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Carl Zeiss sem images and corresponding mapping profiles
a <t>Synchrotron</t> <t>XRD</t> patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 <t>K</t> by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.
Sem Images And Corresponding Mapping Profiles, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


a Synchrotron XRD patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 K by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.

Journal: Nature Communications

Article Title: Lightweight single-phase Al-based complex concentrated alloy with high specific strength

doi: 10.1038/s41467-024-51387-6

Figure Lengend Snippet: a Synchrotron XRD patterns of the as-cast sample (black) and the sample synthesized at 15 GPa and 1500 K by LVP (red). b , c HRTEM and SAED images of the HPHT-synthesized sample, revealing an SP-FCC structure. The SAED pattern is obtained along the [011] direction. d Bright-field TEM image, showing a fairly uniform distribution of numerous dislocations in the HPHT-synthesized sample. e EBSD image of the HPHT-synthesized sample, showing the grains with different orientations. The inset shows the orientations corresponding to different colors. f APT reconstruction of the HPHT-synthesized sample. Maps of 5.8 at.% Li, 8 at.% Zn iso-concentration and their overlap are displayed to depict local chemical fluctuations. g Composition analysis along a line crossing the interface between the matrix and nanoscale clusters. The error bars are standard deviations of the mean.

Article Snippet: Phase constitution and microstructure of the alloys were characterized using XRD with Cu Kα radiation, Zeiss Supra55 SEM equipped with EDS, and TEM (Tecnai G2 F30, 300 kV).

Techniques: Synthesized, Concentration Assay

a Synchrotron XRD patterns of the as-cast Al 55 Mg 35 Li 5 Zn 5 alloy during compression up to 22 GPa at room temperature. No phase transition was observed. b Synchrotron XRD patterns of the Al 55 Mg 35 Li 5 Zn 5 alloy as a function of temperature when subjected to a compression pressure of 10 GPa. The intermetallic compounds (IMCs) in the as-cast alloy remained stable up to ~ 950 K at 10 GPa, then a phase transition started at ~ 950 K. NaCl served as the pressure-transmitting medium and thermal insulator here. The red and black tick marks in Fig. 4b represent the peaks of IMCs and NaCl.

Journal: Nature Communications

Article Title: Lightweight single-phase Al-based complex concentrated alloy with high specific strength

doi: 10.1038/s41467-024-51387-6

Figure Lengend Snippet: a Synchrotron XRD patterns of the as-cast Al 55 Mg 35 Li 5 Zn 5 alloy during compression up to 22 GPa at room temperature. No phase transition was observed. b Synchrotron XRD patterns of the Al 55 Mg 35 Li 5 Zn 5 alloy as a function of temperature when subjected to a compression pressure of 10 GPa. The intermetallic compounds (IMCs) in the as-cast alloy remained stable up to ~ 950 K at 10 GPa, then a phase transition started at ~ 950 K. NaCl served as the pressure-transmitting medium and thermal insulator here. The red and black tick marks in Fig. 4b represent the peaks of IMCs and NaCl.

Article Snippet: Phase constitution and microstructure of the alloys were characterized using XRD with Cu Kα radiation, Zeiss Supra55 SEM equipped with EDS, and TEM (Tecnai G2 F30, 300 kV).

Techniques: Sublimation